亚洲伦乱视频_久久99精品久久久久久野外_毛片久久久久久久_亚洲人成网亚洲欧洲无码久久_蜜桃麻豆视频_欧美黑人精品一区二区

The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.

■ Non-contact measurement
■Resistivity measurements by eddy current probe
■No sample preparation
■Application:
  ■multicrystal silicon Ingot/ Block /Wafer
  ■monocrystal silicon Ingot/ Wafer
■Resistivity Range:0.001-100ohm.cm
■Accuracy:2%